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KAMMRATH & WEISS
We are the global market leader in the development and manufacturing of high-precision microscope technology. Our fields of application know no boundaries. We support our customers from various industries, public authorities, and in research and education where their research projects require customized solutions. We are accustomed to thinking outside the box. We are happy to venture off the grid with you as an idea generator for exciting future innovations. We have already mastered many challenges and created solutions. Discover our products, which are already in use around the world. We are there for you!
Dynamic Testing for Electron Microscopy, Optical Microscopy and CT Tomography
Tension and Compression Modulus
Tensile and compressive modulus
Deformation device for scanning electron microscope compatible with EBSD, optical microscope, AFM or similar.
For test objects 30 to 60 mm long, up to 10 mm wide and up to 4 mm high.
Clamping for fibers, sheets, polymers, rubber, wood, metals, glass, ceramics ·
Large 40 mm pulling stroke, high mechanical rigidity.
System for all materials and power ranges.
Enables force-displacement diagrams, stress-strain diagrams and much more. Computer-controlled microprocessor unit with extensive software package.
Tensile modulus of the fiber
Load unit for individual fibers, fiber bundles, or sheets.
It allows tensile testing with extremely low forces and the finest force resolution (up to 1×10-5 N).
Drawing speed from 0.1 to 20 µm/sec.
Accessories available for a wide variety of materials.
Tension, compression, and torsion module for computed tomography
The device is a further development of tension/compression modules.
During tomographic measurement, the entire mechanism remains stationary, only the sample is rotated synchronously by two motors.
Tensile and compression tests up to 2 kN (optional: 5 kN), bending tests up to 2 kN, sample torsion up to 3 Nm.
Includes adapter for mounting on the Z stage of the CT scanner.
Extraction micromodule
The sample stage accessory for the SEM can also be used under the optical microscope.
Designed for static or alternating loads on small and very small solids through fatigue platform and piezo-controlled gripper.
Unusually strong surfaces of the micro tweezers allow them to grip mineral or hard metal objects without leaving a trace.
Temperature Modules
Heating module at 1500 °C
Table-top accessory (module) for heating experiments (room temperature up to 1500 °C), developed to work under "variable pressure" and high vacuum conditions.
Designed with a water-cooled motorized "lid," making it ideal for long-term heating experiments.
Large sample area (10 x 10 x 2 mm³). Other sample geometries can be accepted upon request.
Optional: EBSD support.
Módulo de transferencia de calor 1050 °C
Accesorio de mesa (módulo) para experimentos de calentamiento (temperatura ambiente hasta 1050 °C), desarrollado para trabajar en condiciones de "presión variable" y alto vacío.
Diseñado con una "tapa" motorizada, lo que lo hace ideal para experimentos de calentamiento alargo plazo.
Función "Transfer" mediante junta tórica insertable. esto significa que las muestras sensibles al aire o al agua se pueden transportar de forma segura desde la guantera hasta el SEM.
Opción: Válvula de aguja en la brida de vacío.
Gran área de muestra (10 x 10 x 2 mm³). Se pueden admitir otras geometrías de muestra a pedido.
Opcional: compatibilidad con EBSD.
Heating module 800 °C
To observe small samples at high temperatures in the scanning electron microscope.
Free access sample at the top.
Minimal heat transfer to the table mechanics through a multi-layer reflective insulation layer (shielding).
Sample holders in various shapes > flat or bucket-shaped.
Includes vacuum flange and fixing mechanism for SEM sample chamber.
Heating module 300°C / 500°C
For observing samples under a scanning electron microscope up to a size of approximately Ø 30 mm at ambient temperatures up to 300°C / 500°C.
Unlike many other heating devices, this sample stage accessory can also be heated in air to maximum temperature.
Sample holders in various shapes > flat or bucket-shaped.
Includes vacuum flange and fixing mechanism for SEM sample chamber.